ENA and ENA-X Configurations This section describes standard configurations, options, accessories, upgrade kits and compatible peripherals for the Keysight E5080B ENA and E5081A ENA-X vector network analyzers (VNA). The instruments are equipped with an Online Help system available within the instrument in English only. All ENA and ENA-X documentation is available on the product page: www.keysight.com/find/ena. Test Set Options Choose one of the frequency and test set options for the analyzer. Option 2xx indicates two test ports and option 4xx indicates four test ports. To add options to a product, order the corresponding item number (E5080B- or E5081A-xxx). E5080B ENA Option Number Description Test Port Connectors 2-Port Options E5080B-240 2-port test set, 9 kHz to 4.5 GHz Type-N (f) E5080B-260 2-port test set, 9 kHz to 6.5 GHz Type-N (f) E5080B-290 2-port test set, 9 kHz to 9 GHz Type-N (f) E5080B-2D0 2-port test set, 9 kHz to 14 GHz Type-N (f), 3.5 mm (m)

Spectrum Analysis Hardware Options (E5080B Only) Choose one of spectrum analysis options for the E5080B (Option 09x). The frequency of Option 09x must match with the operation frequency of the test set. S96090B application software is required for spectrum analysis using the Option 09x. Spectrum analysis on E5081A is enabled with S960904B or S960907B software. There is no required spectrum analysis hardware option on the E5081A.

E5081A ENA-X with Configurable Test Set The E5081A ENA-X comes with a configurable test set on ports 1 and 2 to allow for flexible setup of test systems by integrating with external components 1 such as booster amplifiers, attenuators, or directional couplers. This functionality combined with modulated signal analysis allows you to characterize highly integrated components with a single connection. High-Power S-Parameter Tests One example using the E5081A with configurable test set is S-parameter measurements of high-power devices. When you need an input level higher than the analyzer’s source can provide, booster amplifiers are necessary to increase the power level incident upon the DUT. However, the reference signal is measured before the booster amplifier with a standard configuration of a 2-port VNA, and temperature drift or high reverse isolation of a booster amplifier will prevent accurate reflection measurements of the DUT’s input. A typical configuration for high-power measurements with the 2-port E5081A is shown. Reflected and transmitted signals of the DUT are detected with all the logical receivers, and the VNA firmware provides measured high-power S-parameters.